PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
Test System
- PXI Test & Measurement Solutions
- PXI Semiconductor/IC Test System
- PXI/cPCI Programmable Power Supply - 16-bit Read Back Voltage and Current at Output
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product
PXIe High Voltage Device Power Supply - 2 Channels Per Card, 18-bit Voltage Programming Resolution and Measurement Resolution
33021
Max. 48V DC output with 2 channels per card, 12V-48V independently Programable voltage level, Max. 250mA current per channel
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PXIe Programmable Device Power Supply
33020
High channel density with 8 channels per card 6V-12V independently programable voltage level Max. current gang feature providing max. 4A output per card
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product
Universal Relay Driver Control - PXIe, 32 Channel Direct Relay Drivers
33011
PXI-e based universal relay control for semiconductor load boards, 32CH direct relay drivers, 2 lanes of SPI relay control interface
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product
High Speed PXIe Digital IO Card - 32 Channels, Extendable up to 256 Channels in One Chassis
Model 33010
Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO Card consists of a Sequencer Pattern Generator (SQPG) and 32 Channels of fill ATE-like features. The 33010 IO card is expandable up to 356 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
