Memory Test System

The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.

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Topics

Memory Test Systems
System Test
Test Systems
Test
Systems
Memory
Universal Flash Storage
Communication Protocol
Communications Test
Protocol Test