![IEC60884-1 Low Temperature Thermal Shock Test Device](https://d27wgn5g4t3wja.cloudfront.net/products/2394f75d-eeac-4f69-a1db-e7685ca3c8e5/438034.png)
IEC60884-1 Low Temperature Thermal Shock Test Device
CX-DWC - Shenzhen Chuangxin Instruments Co., Ltd. (Cxin)
IEC60884-1 Uses: It is used to evaluate the impact resistance of electrical accessories under low temperature conditions, and also to evaluate the low temperature impact resistance of wire and cable.