![In-circuit Test](https://d27wgn5g4t3wja.cloudfront.net/img/bdc459b4-9e2d-976b-bd6d-3fd691035b38/280299.png)
In-circuit Test
Medalist i1000 Systems - Keysight Technologies
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.