XRF Instruments
Helmut Fischer AG (Fischer Technology, Inc.)
FISCHERSCOPE® X-RAY XRF measuring instruments are exactly what you need. Precise, fast, reliable and durable: Measure coating thicknesses and analyze materials non-destructively, contact-free and conveniently. The instruments are easy to use and suitable for almost any application.
Topics
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE X-RAY XULM
Flexible measuring devices for coating thickness measurement of filigree parts like plugs, contacts or wires as well as for the determination of the metal content of electroplating baths and the composition of simple alloy layers.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
