High-Speed Digital Testing

Silicon Turnkey Solution, Inc. (STS)

High-speed devices create significant challenges for functional testing, for example, the need for high-bandwidth interfacing to maintain signal integrity at multi-gigabits per second data rates and the ability to measure high-speed bit error rate and jitter. STS brings extensive experience in high-speed functional testing for commercial, military and aerospace devices to meet the most stringent customer requirements. Our highly integrated testing laboratory and efficient workflow are designed with one goal in mind: to shorten time-to-market and enhance our customers’ ability to compete.