![WAFER MVM-SEM® E3300 Series](https://d27wgn5g4t3wja.cloudfront.net/products/35dc5bcc-7ea9-43e3-a857-41fe99431299/569800.png)
WAFER MVM-SEM® E3300 Series
E3310 - Advantest Corp.
The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.