At-Speed Non-Intrusive Functional Testing
ScanExpress JET - Corelis, Inc.
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.
ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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product
Test & Programming Software
ScanExpress
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
