Single Event Effects Test System
SEE-RAD - Hilevel Technology, Inc.
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
