Advanced Metrology System

This top performance system is designed for applications where high-speed defect detection and precision measurements on wafers and other parts are required. It is well suited for use as a dedicated production tool or as a versatile process
development system. It features a powerful set of automated as well as semi-automatic optical/ video tools optimized for high accuracy, production throughput, and ease of use.

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Topics

Systems
Metrology
Video Measurement
Well
Defect
Detection
Measurement
Optical
Video
Wafer