Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)

*Non-contact measurement of resistivity, thickness and conductivity (P/N)
*Number of cassette station can be changed by customers request
*Eddy current method for resistivity, Electric capacitance method for wafer thickness
*Temperature correction for silicon wafer function

Add To List Share Product Home Contact/Sales Distributors/Reps Video Company Catalog

Topics

Wafer
Measurement
Drives
Systems
Wafer Resistivity
Wafer Thickness
Non-contact Temperature
Eddy Current
Electric Conductivity
Resistivity