Semiconductor

Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.

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Topics

Semiconductor
Semi-conductor
Control
Instruments
Measurement
Parallel
Polarization Extinction Ratio
Processing
Speed
Testing