Emulation / Prototyping Solutions

Test Evolution Corporation (TEV)

Debugging issues found during post silicon validation is challenging. There is limited visibility into the internals of the chip. Standalone protocol-specific box instruments each have their own API and capabilities for programming stimulus and debugging responses from the chip. Generating appropriate stimulus and response data at the chip interfaces to isolate the problem in a repeatable way is very time consuming. Then there is debugging of the tests themselves to insure they work within the specified functionality of the IC.