Semiconductor ATE

The overriding market position for all Xcerra products is to deliver the overall lowest cost of ownership. Cost of ownership is comprised of three dimensions, capital cost, throughput and operating costs. Xcerra testers excel in each of these areas. The primary industrial end market drivers for our testers are automotive, consumer and mobility. Simply put our testers allow for the high volume production of electronics that allow people to be entertained, communicate, be more productive and stay safe.

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Semiconductor ATE Diamondx Test Platform

DxV - Xcerra Corp.

leverages Diamondx high performance PCIe architectureworkstation fully integrated inside system5 instruments slots configurable with range of Diamondx instrumentsUnison software compatibility with other Xcerra test platformstrue zero footprint production set up

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Semiconductor ATE

PAx-ac RF PA/FEM System - Xcerra Corp.

PAx-ac can be configured with a range of instruments that are designed to address the test challenges for a broad range of RF power amplifiers and front end modules used in cellular and connectivity applications, including 802.11AC, the emergent 802.11ax standard, LTE-A, HSPDA, WCDMA, GSM, Edge, WCDMA, Bluetooth pus a variety of standards. <>

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Test of Microcontroller and Cost-Sensitive Consumer and RF-Connectivity ICs

Diamond10 Test System - Xcerra Corp.

Key Featuresuniversal instrument slots, allowing easy scaling from single to multisite and from digital only to mixed-signal configurationsan ultra-small footprint, ideal for lab development or high-volume production96-channel digital instruments featuring 100 Mbps operation with per-pin timing, formatting, levels and PMUs, along with scan and DSP data source and capture available on any channelhigh performance mixed-signal instrumentation with four channels of audio/video/baseband source and measureDSP instrumentation with four channels each of analog source and measure covering both audio and video applications, available in a single slot powerful mixed signal instrumenthigh-density analog instruments with 16 or 72 channels of high-precision DPS, voltage/current source and measurement capabilities, enabling efficient, cost-effective multisite

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RF Test Solution for 4G and Beyond

DragonRF - Xcerra Corp.

configurable with 16 or 32 Universal RF ports per module with an optional port to pin expander doubling the number of RF ports to 64 pinstwo DragonRF instruments can be configured taking the maximum available RF pins up to 128 RF pins6 GHz RF modulable source and 8 GHz RF measure<1 ms RF settling time on level and frequency changequad site and octal site RF source with single and dual synthesizer respectivelyup to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurementsreal time Dynamic Range Enhancer (DRE) per RF measure pathcompact footprint RF generatorsindustry-leading source muxing flexibilitylatest RF Synthesizer technologycross-platform test system software: Unisonavailable across a range of Xcerra test platforms thus ensuring the most cost effective test capability no matter the end application

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Integrated Multi-System Architecture

IMA - Xcerra Corp.

Flexibility: create large tester arrays or reconfigure a tester array back into singulated test cells, thereby achieving overall higher asset utilization.save capital by investing in compact, lower cost building blocks.Multi-site Efficiency:IMA test arrays utilize parallel processing in the multi-system architecture. This results in near 100% multi-site efficiency as additional testers are added to a tester array.Resource Density:an IMA tester array of Diamond systems has the highest resource density offered today.this extraordinary resource density facilitates docking to a single handler or probers in high multi-site applications further reducing production floor space, capital associated with handling equipment and energy consumption, creating a more efficient test floor and significantly lowering costs.

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Testing of DSP, Power, Automotive, Mixed Signal, & RF Applications

X-Series Platform - Xcerra Corp.

market leading 0 pin infrastructure costs designed for mixed signal testingcost effective, incremental investmentprogram and DUT site compatibility across the entire platformRF port scalability to 40 ports and 8GHz (18GHz with Scalar Frequency Extender)full featured mixed signal digital pins, up to 1024tester-independent feature-rich software environmentbroad range of DC instrumentsDSP instruments support both modulation and DUT-centric testing

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Semiconductor ATE

Semiconductor ATE Diamondx Test Platform

Semiconductor ATE

Test of Microcontroller and Cost-Sensitive Consumer and RF-Connectivity ICs

RF Test Solution for 4G and Beyond

Integrated Multi-System Architecture

Testing of DSP, Power, Automotive, Mixed Signal, & RF Applications