Wafer/Chip/Package Semi-automated ESD Tester

400SW - Tokyo Electronics Trading Co., Ltd. (tet)

Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection.