Customized Ellipsometers

Nano-View Co. Ltd. (nano-view)

~0.1 nm thickness difference can be seen by IE-1000.
Thickness distribution of thin film can be imaged.
Thickness and optical images of semiconductor device, display, and bio samples.
IE-1000 can show the images which can not be seen by conventional microscope.
Defect of semiconductor and display can be seen directly.
Easy and fast operation.