On-Wafer Measurements
Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
Topics
- Measurement
- RF Analyzers
- Temperature Chucks
- Thermal Chucks
- Data Analyzers
- Device Characterization
- Network Analyzers
- RF Switching
- Control Software
- Network Testers
- Wafer Probers
- Modeling
- Temperature
- Analyzers
- RF
- Characterization
- Chucks
- Control
- Data
- Network
- Probers
- Semiconductor
- Semi-conductor
- Software
- Switching
- Testers
- Wafer
- Well
