InterconnectPlus Boundary Scan

InterconnectPlus Boundary Scan

IEEE 1149.1 is a standard approved by the Institute of Electrical and Electronics Engineers (IEEE) in 1990 that allows testing of a device without the need to know the function of the core logic of the device. This is achieved in large part through the use of a chain of registers in series; each register associated with a signal pin of a device. This boundary register is located between the core logic of the device and the pin of the device leading to the outside of the device package. The behavior of these boundary registers are controlled by what is called the TAP controller. This architecture is implemented fully within the silicon of the device. (Fig 1)