
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A - High Power Pulse Instruments GmbH (HPPI)
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network
*Wafer, package and system level HBM testing
*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions
*No trailing pulses
*Integrated 10 kΩ charge removal resistor
*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input
*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input
*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing
*Integrated DC test DUT switch with automatic switch control
*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes
*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses
*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)
*The sofware can control automatic probers for fast measurements of complete wafers
*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead
*System controller size 483 mm x 487 mm x 133 mm
*High performance and high quality components
*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
Topics
- Test Systems
- System Test
- HBM
- Systems
- Test
- JEDEC
- kV
- High Voltage Test
- Automatic Test Systems
- High Voltage Testers
- System Level Test
- High Voltage
- Control Systems
- Sensor Test
- HIgh Current
- Pulse Current
- Pulse Waveform
- Voltage Standards
- Switch Test
- Network Monitoring
- Time Standards
- Voltage Testers
- Component Test
- Resistor Test
- Sensor Testers
- Network Load
- Network Testers
- Performance Testing
- Wafer Level
- Wafer Probers
- Component Testers
- EHF
- Millimeter Wave
- Millimetre Band
- MM
- Digital
- DUT
- Measurement
- Oscilloscopes
- Pulse
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- DC
- Current
- Data
- Discharge
- Monitoring
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- Standards
- Testing