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Direct conversion from cycle driven simulation data
Test program generator - Test Insight Ltd. (Test Insight)
Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester.
TDL/WGL/STIL to tester conversion
Supports STIL ext 0,1,2 constructs
Easy to use and cost effective conversion solution
Optimize tester resources usage
Supports advanced tester features (Such as Xmode, Multi-port etc’)
Compress and minimize vectors count
Allow direct tester binary patterns creation