
Conductivity Type (P/N) Checker By Contact Thermo-electromotive Force Method (seebek Effect)
PN-12α - NAPSON Corp.
*Thermo electrode and cold electrode is mounted detecting part of measuring probes
*Possible to check most figure of sample such as single crystalline silicon wafer, bulk, ingot and so on
*Please select from 2 types;
1) 2 probe ver.(Hot probe, Cold probe),
2) 1 probe ver.(Hot & Cold probe)