Electrical Probe Systems
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.
Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.
Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.
Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.
Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
