Materials Test System

ModuLab XM MTS - Ametek Scientific Instruments (Ametek SI)

I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)
P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials)
High-speed pulse (used to activate charge carriers in electronic and dielectric materials)
Staircase and smooth stepless analog ramp waveforms
Impedance, admittance, permittivity / capacitance, electrical modulus
C-V capacitance - voltage, Mott-Schottky
Automatic sequencing of time domain and impedance/capacitance measurements