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LEON In-Circuit Test Systems

LEON In-Circuit Test Systems

The LEON Gen III Embedded PCB Tester combines classical analog in-circuit test (ICT) or manufacturing defect analysis (MDA) with additional functional test capabilities on a single PXI board. Multiple embedded testers can be configured in a single system for parallel test and high throughput.Highlights Combined test system ICT, FCT Digital test using JTAG In-system programming Open and flexible platform Small footprint Combines up to 6 instruments 2xPMU, 1xDVM, 1xHVCs 4xADC, 4x DAC High Speed Test Execution Parallel Test with max 16 modules Automated test sequencing Custom extension modules

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