![Wafer Inspection System](https://d27wgn5g4t3wja.cloudfront.net/img/5e2eeb9d-145e-1669-dd7c-046c949e05a3/304899.png)
Wafer Inspection System
INSPECTRA® Series - Toray Engineering Co., Ltd.
INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.