Smart Card Module Test Cells

Smart Card Module Test Cells

Current and voltage measures are executed on defined pins, in stable conditions.

Measurements:

- Open/short
- Input leakage current
- IDD Supply instant/average current test (static/dynamic mode)
- Input capacitance @13 MHz and inductance
- Retro modulation index (RMI)

Test of passive devices:

- Capacitors
- Resistors
- Resonators

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