Analog Mixed Signal Testers
- PC-performance independent: multiple SPEA CPUs
provide test program timing, while pc replacement does
not require the test program requalification
- Pattern-based programming: -30% test time vs
competitors
- 64-line synchrobus and 16-line high-speed synchrobus for
real-time instrument synchronization: no embedded delay
when running pattern-based testing
- 99% parallel test efficiency
- Multi-site test capabilities for up to 256 devices in parallel
- High-density, floating instruments, for true parallel analog
test
- Universal slot architecture, up to 1,408 channels
- RF generators up to 3 GHz
