Smart Card Testers
CT1000 - SPEA S.p.A. (SPEA)
The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols, such as: USB-Keys, MMC, Micro-SD (with and without CPU inside), M-SIM, HD-SIM, SIM-WAVE, and I2C.