EV518 Test System
Test Evolution Corporation (TEV)
The EV518 test system leverages AXIe and PXI/PXIe standards to provide high end semiconductor ATE performance in a compact, low-cost, industry standards based form factor. With support for a wide range of digital, analog and RF instrumentation, the EV518 is perfectly suited for post-silicon validation and characterization as well as multi-site production test of consumer digital and wireless devices. Low latency, high speed PCI/PCIe infrastructure, combined with industry leading settling times, give the EV518 exceptionally fast test times and high parallel test efficiency.
Topics
- System Test
- Test Systems
- Test
- Systems
- Production Test Systems
- Time Standards
- Semiconductor Test
- Test Ranges
- Wireless Test
- Analog Digital
- Device Characterization
- Digital
- Standards
- Time
- Analog
- ATE
- Automatic Test Equipment
- AXIe
- Characterization
- Infrastructure
- Instrumentation
- Parallel
- RF
- Semiconductor
- Semi-conductor
- Speed
- Validation
- Well
- Wireless
