![Optical Metrology System](https://d27wgn5g4t3wja.cloudfront.net/products/920843d9-90bc-47fe-abfe-fc65ee88484e/415080.png)
Optical Metrology System
BENCHMARK 300 - VIEW Micro-Metrology (VIEW)
The VIEW Benchmark™ 300 is engineered for high performance and reliability in a floor model package. Advanced optics, illumination, image processing, and available Continuous Image Capture make VIEW Benchmark a world-class metrology system.
-
High Accuracy Dimensional Metrology System
Pinnacle 250 - VIEW Micro-Metrology
-
Critical Dimension Measurement System
MicroLine® Series - VIEW Micro-Metrology
-
Compact General-Purpose Metrology System
Benchmark 250 - VIEW Micro-Metrology
-
Compact Design Measurement System
Benchmark 450 - VIEW Micro-Metrology
-
Dimensional Metrology System
PINNACLE PLUS - VIEW Micro-Metrology
-
Dimensional Measurement System
MICROLINE AF - VIEW Micro-Metrology