![X-ray Fluorescence (XRF) Measuring Instrument](https://d27wgn5g4t3wja.cloudfront.net/img/56e4d8e1-0fec-4e52-a6d0-d8b06f207da8/262324.png)
X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-ยต - Helmut Fischer AG (Fischer Technology, Inc.)
Measuring instrument optimised for micro-analysisDepending on the X-ray optics, structures with a size of100 m or less can be analysedVery high intensities and thus good precisionEven for thin coatings, measurement uncertainty < 1 nm possibleSuitable only for plane or nearly plane samplesLarge and spacious measurement chamber with a cutout(C-slot)Automated series testing with fast, programmable XY-stage