MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test (MPI AST)
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
Topics
- Probe Systems
- Probes
- Systems
- Discrete Device Test Systems
- Power Test Systems
- Production Test Systems
- Automatic Test Systems
- Automatic Test Equipment
- RF Power
- RF Probes
- System Test
- Test Probes
- Test Systems
- Power Calibration
- Communications Test
- Component Test
- Semiconductor Test
- Discrete Device
- Discrete Semiconductor
- Power
- RF
- Test
- Automation
- Calibration
- Communication
- Component
- EHF
- Equipment
- Measurement
- Millimeter Wave
- Millimetre Band
- MM
- Photonics
- Semiconductor
- Semi-conductor
