Phase Noise and Allan Deviation (ADEV) Test Set

5120A - Microsemi Corporation

The all-digital 5120A High-Performance Phase Noise and Allan Deviation (ADEV) Test Set with Ultra Low Noise Floor transforms the way accurate phase noise and Allan deviation measurements are made. This simple one-box solution makes fast yet accurate single sideband (SSB) phase noise and ADEV measurements at the click of a button, all at a fraction of the cost of alternative solutions. What used to be complicated and costly are now easier, more accurate, and more cost effective.