![X-ray Fluorescence Measuring Instrument](https://d27wgn5g4t3wja.cloudfront.net/img/56e4d8e1-0fec-4e52-a6d0-d8b06f207da8/262322.png)
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE XDL - Helmut Fischer AG (Fischer Technology, Inc.)
Robust instrument suited for coating thickness measurements, even at large measuring distances (DCM, stroke 0-80 mm)Features a fixed aperture and a fixed filterSuitable for structure sizes starting at about 1 mmLarge and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is availableStandard X-ray tube, proportional counter tube