Laser Ellipsometer
The laser ellipsometer can be utilized to characterize single films and substrates from selectable, application specific angles of incidence.
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Laser Ellipsometers
CER – SE 500adv
* The SE 500adv combines ellipsometry and reflectometry, * Eliminates the ambiguity in layer thickness determination for transparent films, * Extends thickness measurement to 25000 nm. # Laser wavelength 632.8 nm# Spectral range of reflectivity from 450 nm to 920 nm wavelength# Spot size 80 ?m
