Inspects MEMS and Wafer Level Devices

NorCom 2020-WL - NorCom Systems Inc. (NorCom)

The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.

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Topics

Wafer Level
Wafer
Level
MEMS
System Level Test
Wafer Inspection
System Test
Test Systems
Inspection Systems
Test