Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System - Impulse Semiconductor Inc.
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
Topics
- HIgh Current
- Impulse Current
- Current
- Impulse
- Semiconductor
- Semi-conductor
- Transmission Line Pulse
- ESD Test Systems
- High Voltage Test
- System Level Test
- Pulse Current
- ESD Test
- High Voltage
- Impulse Test
- Impulse Voltage
- Resistance Test
- Semiconductor Test
- System Test
- Test Systems
- Transmission LIne
- Wafer Level
- ESD
- TLP
- Level
- Line
- Pulse
- Resistance
- Systems
- Test
- Transient
- Transmission
- Voltage
- Wafer
