![Probe Cards](https://d27wgn5g4t3wja.cloudfront.net/products/c03e2481-a09e-4fdc-b426-0652bc9c957a/442078.png)
Probe Cards
Minitile™ with Advanced Cantilever™ technology and WedgeTile™ - Celadon
Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.