JTAG/Background Debug Mode Test System PXI Card

NX5300 - Marvin Test Solutions, Inc.

The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems. Advanced capabilities include simultaneous support of up to 255 devices on a single scan chain, support of sixteen NX5300 systems controlled by single host machine and configurable JTAG/BDM clock rates up to 24 MHz. The NX5300 includes 16 high-speed measurement channels. Each channel can measure logic levels, frequency, count events and perform a CRC check at rates up to 100 MHz.