EV1018 Test System

Test Evolution Corporation (TEV)

The EV1018 test system leverages AXIe and PXI/PXIe standards to provide high-end semiconductor ATE performance in a compact, low-cost, industry standards based form factor. With support for a wide range of digital, analog and RF instrumentation, the EV1018 is perfectly suited for post-silicon validation and characterization as well as multi-site production test of consumer digital and wireless devices. Low latency, high speed PCI/PCIe infrastructure, combined with industry leading settling times, give the EV1018 exceptionally fast test times and high parallel test efficiency.