Optical Surface Profiler
Contour LS-K - Bruker Nano Surfaces
Contour LS-K 3D Optical Profiler utilizes LightSpeed™ focus variation technology to uniquely enable both high-resolution images and quantifiable data. The system rapidly captures surface data with a large field of view (FOV) at vertical scanning speeds up to 5 millimeters per second. Data-rich images are displayed in high-resolution and in real color within seconds.