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Atom Probe Assist

Atom Probe Assist

Atom Probe Assist provides an innovative means of monitoring grain boundary position between FIB milling steps to ensure that a grain boundary is detected and correctly positioned for subsequent Atom Probe analysis. With Atom Probe Assist, transmission-EBSD (t-EBSD) can be used to measure and image the crystallographic orientation and determine grain boundary position quickly and easily within a single instrument.

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