Burn-In Test System

Transform your burn-in testing strategy with the ATS 5030 Burn-in Test (BiT) Platform. This next-generation semiconductor tester offers independent per-site burn-in for semiconductor packaged devices. Deployed globally, the ATS 5030 BiT Platform is a turnkey system that consistently delivers industry-leading thermal stress test for billions of semiconductor devices.

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Topics

Test Systems
System Test
Burn-In
Test
Systems
Semiconductor Test
Test Platform
Thermal Test
Semiconductor
Semi-conductor