Scatterometers / Thin film Metrology Systems
Olympian Series - n&k Technology, Inc. (n&k Technology)
DUV-Vis-IR (Wavelength Range: 190nm â 15,000nm) Scatterometers / Thin Film Metrology Systems: The n&k Olympian, n&k Olympian-450 and n&k Olympian-M are DUV-Vis-IR scatterometers/thin film metrology systems with micro-spot technology, covering the wavelength range from 190nm â 15,000nm. With the inclusion of the infra-red wavelength range, the Olympian Series extends the capabilities of n&kâs DUV-Vis-NIR scatterometer series â the OptiPrime-CD Series.