Low-leakage Switch Matrix Family
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
- Parameter And Device Analyzers, Curve Tracers
- Low-leakage Switch Matrix Family
- Precision Current-Voltage Analyzers
- Power Device Analyzer / Curve Tracer
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product
Low Leakage Switch Mainframe
B2201A
The B2201A reduces the cost of test by enabling characterization tests to be automated, with only slight compromise to the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators.
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product
Low-leakage Switch Mainframe
E5250A
The Keysight E5250A low-leakage switch mainframe expands a single measurement station, such as the Keysight B1500A, 4155C, or 4156C, to an automated measurement system. Plug-in modules can be configured either as a cross-point matrix for general parametric measurements or as a multiplexer for long-term reliability measurements.
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product
FA Leakage Switch Mainframe
B2200A
The B2200A reduces the cost of test by enabling characterization tests to be automated, without compromising the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators.
