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XRF In-Line Analyzer

XRF In-Line Analyzer

X-ray Fluorescence (XRF) analysis is a powerful qualitative and quantitative tool ideally suited to the analysis of film thickness and composition, determination of elemental concentration by weight of solids and solutions, and identification of specific and trace elements in complex sample matrices. The SMX-ILH XRF system is a process control and yield management platform that offers integrated and remote module configurations for in-line atmospheric analysis of coating composition and thickness measurements of rigid and flexible substrates. This system allows the movement of coated material through the measuring enclosure for full panel analysis either in static or across the gradient locations through a motorized, programmable single or dual integrated measuring module.

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