Probe Card

VC20E Series - Celadon Systems, Inc.

The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.

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Topics

Probe Cards
Probes
Cards
Probe Card Interfaces
Wafer Level Reliability
Test Probes
Test Cards
Wafer Probes
Probe Interfaces
Parametric Test