Analytical Services
Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.
Park can provide measurements in the following areas:
● Topography (surface roughness, grain size, step height, etc.)
● Mechanical Properties (stiffness, etc.)
● Electrical properties (capacitance, conductivity, etc.)
● Thermal properties
● Magnetic properties
These properties can be measured in air or liquid, depending on your needs.
