Showing results: 61 - 75 of 115 items found.
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MXI Quadra 7 -
Nordson Corporation
Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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National Technical Systems
The ever advancing electronics industry requires an increasing need for electronic component testing (IC testing) and component verification. The component test capabilities and component verification lab at NTS performs test and inspection to determine proper component functionality, verification or failure analysis (F/A).
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Leica Microsystems
For inspection, documentation, and analyses such as measurement in 2D and 3D as well as 3D topographies in surface metrology, they have become increasingly popular in production, quality control and quality assurance, failure analysis, research and development as well as forensics. Digital microscopes even have their areas of application in the life sciences.
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JewelBox 70T -
Glenbrook Technologies
The Jewel Box 70-T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system?s high-resolution MXRA® x-ray camera and 10-micron MicroTech? x-ray source provide magnification from 7X to 2000X, with resolution of 100 line pairs/mm.
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LCS- 4000 Series -
MicroXact, Inc.
The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.
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InterWorking Labs, Inc.
Set up in less than five minutes - Windows or LinuxCustomize tests via Wizards, Script Generators, and moreAutomate operation with unambiguous test resultsIntegrate with other test harnesses and test toolsIncludes conformance, compliance, vulnerability, robustness, stress, and performance testingInvestigate failures and quickly resolve them with powerful diagnostic and analysis tools
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MultiTrace -
Robson Technologies, Inc.
MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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FilterCHECK -
Gastops
Get the full picture immediately with FilterCHECK: accurate on-site damage indication — wherever you do maintenance.Equipment fluid filters have a story to tell. With FilterCHECK, filters reveal an accurate account of component wear and damage, plus a reliable prediction of the time remaining to component failure. Easy to use, field-deployable FilterCHECK automates filter debris analysis, so your team can manage maintenance decisions efficiently. Avoiding component failure, reducing maintenance costs and eliminating service interruptions: three reasons FilterCHECK belongs on the shop floor, wherever mission-critical equipment is serviced and maintained.
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Whitelegg Machines Ltd
Get Immediate Indication of Your Motors’ Health Do you know which of Your Process Motors are Likely to Fail? It is a Question of Efficiency and Potential Failure For online monitoring and measuring of electric motors whilst running. Measuring the motors performance with special analysis software to give a complete picture of the motor, its supply and its load.
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MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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SKF Condition Monitoring Center
Abnormal vibrations are often the first indication of a potential machine failure. Conditions that can cause these vibrations include unbalance, misalignment, looseness of parts, deteriorating rolling element bearing and gear damage. Vibration analysis instruments and systems can help detect many serious problems at an early stage, allowing personnel to undertake remedial work in a timely manner.
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CurveMasterTM -
Hilevel Technology, Inc.
The CurveMasterTM delivers new price/performance efficiency to curve tracing and Failure Analysis. Curve trace has been a standard feature in our full-power chip tester for years, so the CurveMasterTM is built with today’s components and technology. With all new high-accuracy DC Parametrics, you’ll enjoy the most powerful curve tracer you have ever used.
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IVA® MODEL 210S -
Oneida Research Services, Inc
The IVA® system is specifically designed for the quantitative analysis of low molecular weight gases contained in hermetic packages, cavities and other enclosures. The Model 210s concept integrates automated hardware with easy-to-use icon-driven software. Its design permits routine quality control, failure analysis and research level testing operation as a turn-key analytical system. The IVA® Model 210s includes a high-performance, quadrupole-mass spectrometer analyzer, a sample-mounting interface and precision hardware. The instrument is also computer-controlled and equipped with exclusive ORS integrated system control software — which provides instrument control, data analysis, data archiving and ease of operation.
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Profitap B.V.
Profitap fiber TAPs provide secure in-line network access for the monitoring of 1–400 Gbps fiber networks. By splitting the light flowing on the network link, fiber TAPs deliver an exact copy of the data for real-time monitoring and analysis, without disrupting the network. Passive fiber optic TAPs require no power, and therefore introduce no point of failure when deployed in a network.
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Pulse2 -
Sonix Inc.
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.