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Showing results: 391 - 405 of 14442 items found.

  • Test & Test Development for Circuit Card Assembly

    Teledyne Defense Electronics

    Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW

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  • Fused Test Probes with Silicone Test Leads

    AL-57FL - Standard Electric Works Co., Ltd

    ● AL-57FL is an ideal tool which shows the indication of live voltage even with blown fuse.● 2 replaceable fast-acting fuses are built-in. The specs of the fuses are 1000V, 11A with internal rating of 20kA AC/DC.● Provide additional testing protection.● Help to prevent a possible mis-indication when there is voltage present.● CAT III 1000V, CAT IV 600V, 10A with protective cover.● 2mm probe tips, removable 4mm brass caged banana probe tips are also included.● Include High-quality silicone test leads, 1.5 meter long.● Wipe the fused test probes and silicone test leads periodically with a damp cloth and detergent. Do not use abrasives or solvents.● Operating temperature: -20 °C to +50 °C (-5 °F to 120 °F)● One year warranty● Can't be used on current mode with blown fuse.● Rating : EN 61010-031 CAT Ⅲ 1kV 10A / CAT Ⅳ 600V 10A

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  • Temperature Test Chambers & Humidity Test Chambers

    Weiss Technik North America

    Weiss Technik Temperature & Humidity test chambers offer many pre-engineered and custom sizes to fit your exact testing requirements. Available models include a wide range of temperature ramp rates, humidity levels, and many standard and optional features including temperature cycling, steady-state testing, and fast change rate.

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  • PCI Express 5.0 Test Platform

    Teledyne LeCroy

    Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.

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  • Test & Measurement Software

    Test SLATE - Jacobs

    Test SLATE is Jacobs' comprehensive, easy-to-use test control and measurement process management application, ideal for testing virtually any product under a variety of environmental and product conditions. It is the ideal application for a wide range of testing environments, including aerodynamic or climatic wind tunnels, component test stands, automotive test facilities, aircraft engine test facilities, structural test stands, manufacturing validation test stands, and more.

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  • Meter Test Benches

    Test Station - EMSYST Ltd

    The meter test station allows simultaneous testing of 3, 5, 10 or 20 induction or static electricity meters. The test station could be constructed for single-phase electricity meters or for three-phase meters.

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  • Compliance Test Systems

    LMG Test Suite - ZES ZIMMER Electronic Systems GmbH

    The ZES ZIMMER test system LMG Test Suite tests in accordance with the currently valid version of EN 61000-3-2/-12 or EN 61000-3-3/-11 and also supports measurements per ECE R-10.4 Annex 11 (e.g. electromagnetic compatibility of vehicles). As a manufacturer of precision power measurement technology, we are represented on the international standards committee. As a result, changes in standards are immediately incorporated into our test systems.

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  • ScanWorks Boundary-Scan Test

    ScanWorks Boundary-Scan Test - ASSET InterTech, Inc.

    The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.

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  • EN60350-2：2013 Cookware Test Pot Test Vesssel

    CX-G08 - Shenzhen Chuangxin Instruments Co., Ltd.

    EN60350-2：2013 cookware test pot test vesssel

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  • C++ Test Framwork

    Google Test - Google Inc.

    a unit testing library for the C++ programming language, based on the xUnit architecture. It can be compiled for a variety of POSIX and Windows platforms, allowing unit-testing of C sources as well as C++ with minimal source modification.

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  • Optics Test Systems

    Lens Test - Optik Elektronik Gerätetechnik GmbH

    LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.

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  • Processor-Controlled Test (PCT)

    ScanWorks® Processor-Controlled Test - ASSET InterTech, Inc.

    Embedded in that CPU on your circuit board are the instruments that are critical for overcoming today's design challenges. Given the complexity of board designs and chips, you need access to this on-chip technology to diagnose, debug and test your designs. One of the tools that makes up the ScanWorks platform for embedded instruments is Processor-Controlled Test (PCT). It takes advantage of the CPU's debug port for access to the circuit board so it can perform board debug, device initialization, at-speed functional test with structural diagnostics and much more.

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  • Air Data Test

    Flightline/Ramp Air Data Test Sets - D.Marchiori s.r.l.

    The test sets are all digitally controlled through a local or remote keypad and display. The intuitive user interface allows test set functions to be easily controlled with a minimum of key strokes, with all test parameters displayed, and is suitable for both first time and more advanced users. Optionally many of the ADTS can be remotely controlled by a PDA Pocket PC with wireless Bluetooth connection. The intelligent user interface provides protection to both the test set and the UUT. The software rejects entered command values that exceed the pre-selected limit ranges.

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  • Power-Switching Test System

    High Voltage Switching Test System - Accel-RF Corporation

    The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.

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  • Diagnostic Test Tool

    BIRST™ (Built-In Relay Self-Test) - Pickering Interfaces Ltd.

    Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.

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